Weekly Semiconductor Quality Control Metrics Summary

Track and analyze critical quality control metrics across semiconductor manufacturing processes, focusing on defect rates, yield performance, and process stability to maintain production excellence and minimize waste.

Report Objective

Monitor and evaluate semiconductor manufacturing quality control metrics on a weekly basis, focusing on key indicators such as defect density, yield rates, and process stability measures to ensure consistent product quality and identify areas requiring immediate attention or process optimization.

Yield Performance Analysis

Line chart showing weekly yield rates across different product lines

Questions to Consider:

2024-12-012025-01-012025-02-01week91.0%91.5%92.0%92.5%93.0%93.5%sum(yield_rate) vs. product_linesum(yield_rate)product_lineHow are Weekly Yield Rates Trending Across Product Lines?7nm products showing consistent improvement while 14nm remains stable

  • What is the overall trend in yield rates for each product line?

  • Are there any concerning drops in yield that require investigation?

  • How do yield rates compare to historical benchmarks?

  • Which product lines show the most consistency in yield?

  • Are there any bimodal distributions indicating process issues?

3060.0%3080.0%3100.0%3120.0%3140.0%binStart01122(Counts) 7nm, 10nm, 14nm7nm10nm14nmWhat is the Distribution of Yield Rates by Product Line?7nm shows highest variability while 14nm demonstrates stability

Defect Density Tracking

Bar chart displaying defect rates by process stage and product type

Questions to Consider:

LithographyEtchingIon ImplantationMetallizationprocess_stage0.001.002.003.00sum(defect_density)sum(defect_density)How do Defect Densities Vary Across Process Stages?Lithography and Etching stages show highest defect densities

  • Which process stages consistently show higher defect rates?

  • How do current defect densities compare to quality targets?

  • Are there any stages showing significant week-over-week changes?

  • Are there any concerning trends in defect density?

  • Which stages show the most improvement in defect reduction?

  • How do seasonal factors impact defect rates?

2024-12-012025-01-012025-02-01week0.100.120.140.16sum(defect_density) vs. process_stagesum(defect_density)process_stageWeekly Trend of Defect Density by Process StageDefect density showing downward trend in critical stages

Process Stability Metrics

Statistical process control charts for critical parameters

Questions to Consider:

2024-12-012025-01-012025-02-01week0.00.51.0sum(deviation_from_target)Critical DimensionTemperaturePressureFlow RateProcess Parameter Control Chart AnalysisMost parameters within control limits with occasional temperature excursions

  • Which parameters show the most deviation from targets?

  • Are there any patterns in parameter variations across weeks?

  • How frequently do parameters exceed control limits?